Availability = Mean time to fail / (Mean time to fail + Mean time to repair)
Die yield = Wafer yield×(1+Defects per unit area×Die area)N1
where Wafer yield accounts for wafer that are so bad they need not be tested and N is a parameter called the
process-complexity factor, a measure of manufacturing difficulty.
N ranges from 11.5 to 15.5 for a 40nm process (in 2010).
Means - arithmetic (AM), weighted arithmetic (WAM), and geometric (GM):
AM=n1i=1∑NTimei
WAM=n1i=1∑NWeighti×Timei
GM=ni=1∏NTimei
where Timei is the execution time for the ith program of a total of n in the workload,
Weighti is the weighting of the ith program in the workload.
Average memory-access time =Hit time+Miss rate×Miss Penalty
Misses per instructions =Miss rate×Memory access per instruction
Cache index size: 2index=Cache size/(Block size×Set associativity)
Power Utilization Effectiveness (PUE) of a Warehouse Scale Computer =IT Equipment PowerTotal Facility Power